|Title||Low-energy ion scattering: Determining overlayer thickness for functionalized gold nanoparticles|
|Publication Type||Journal Article|
|Year of Publication||2013|
|Authors||Rafati A., R. Veen ter, Castner D.G|
|Journal||Surface and Interface Analysis|
|Keywords||auger-electron-spectroscopy, biology, characterization, delivery, flat, gold nanoparticles, growth, hs-leis, Nanotechnology, overlayer thickness, ray photoelectron-spectroscopy, self-assembled monolayers, sessa, simulation, surfaces, xps|
With the widespread use of engineered nanoparticles for biomedical applications, detailed surface characterization is essential for ensuring reproducibility and the quality/suitability of the surface chemistry to the task at hand. One important surface property to be quantified is the overlayer thickness of self-assembled monolayer (SAM) functionalized nanoparticles, as this information provides insight into SAM ordering and assembly. We demonstrate the application of high sensitivity low-energy ion scattering (HS-LEIS) as a new analytical method for the fast thickness characterization of SAM functionalized gold nanoparticles (AuNPs). HS-LEIS demonstrates that a complete SAM is formed on 16-mercaptohexadecanoic acid (C16COOH) functionalized 14 nm AuNPs. HS-LEIS also experimentally provides SAM thickness values that are in good agreement with previously reported results from simulated electron spectra for surface analysis of X-ray photoelectron spectroscopy data. These results indicate HS-LEIS is a valuable surface analytical method for the characterization of SAM functionalized nanomaterials. Copyright (c) 2013 John Wiley & Sons, Ltd.